Open Access
August 2017 Contact processes on random regular graphs
Steven Lalley, Wei Su
Ann. Appl. Probab. 27(4): 2061-2097 (August 2017). DOI: 10.1214/16-AAP1249

Abstract

We show that the contact process on a random $d$-regular graph initiated by a single infected vertex obeys the “cutoff phenomenon” in its supercritical phase. In particular, we prove that, when the infection rate is larger than the lower critical value of the contact process on the infinite $d$-regular tree, there are positive constants $C$, $p$ depending on the infection rate such that for any $\varepsilon>0$, when the number $n$ of vertices is large then (a) at times $t<(C-\varepsilon)\log n$ the fraction of infected vertices is vanishingly small, but (b) at time $(C+\varepsilon)\log n$ the fraction of infected vertices is within $\varepsilon$ of $p$, with probability $p$.

Citation

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Steven Lalley. Wei Su. "Contact processes on random regular graphs." Ann. Appl. Probab. 27 (4) 2061 - 2097, August 2017. https://doi.org/10.1214/16-AAP1249

Information

Received: 1 April 2015; Revised: 1 June 2016; Published: August 2017
First available in Project Euclid: 30 August 2017

zbMATH: 1373.60159
MathSciNet: MR3693520
Digital Object Identifier: 10.1214/16-AAP1249

Subjects:
Primary: 60K35
Secondary: 05C80 , 60K37

Keywords: contact process , Cutoff phenomenon , random regular graph

Rights: Copyright © 2017 Institute of Mathematical Statistics

Vol.27 • No. 4 • August 2017
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