Heng Lian
Electron. J. Statist. 6, 1-9, (2012) DOI: 10.1214/12-EJS665
KEYWORDS: Akaike information, AIC, Model selection, Poisson regression, 62J12
James M. Flegal, Radu Herbei
Electron. J. Statist. 6, 10-37, (2012) DOI: 10.1214/11-EJS663
KEYWORDS: Markov chain, Monte Carlo, perfect sampling, Bernoulli factory, geometric ergodicity, 60J22
Nicolas Verzelen
Electron. J. Statist. 6, 38-90, (2012) DOI: 10.1214/12-EJS666
KEYWORDS: adaptive estimation, Dimension reduction, high-dimensional regression, high-dimensional geometry, minimax risk, 62J05, 62F35, 62C20
Béatrice Laurent, Jean-Michel Loubes, Clément Marteau
Electron. J. Statist. 6, 91-122, (2012) DOI: 10.1214/12-EJS667
KEYWORDS: Goodness-of-fit tests, heterogeneous variances, Inverse problems, 62G05, 62K20
Saisuke Okabayashi, Charles J. Geyer
Electron. J. Statist. 6, 123-147, (2012) DOI: 10.1214/11-EJS664
KEYWORDS: Markov chain Monte Carlo, exponential families, Potts, Ising, exponential random graph, stochastic approximation
Wei Sun, Junhui Wang, Yixin Fang
Electron. J. Statist. 6, 148-167, (2012) DOI: 10.1214/12-EJS668
KEYWORDS: K-means, diverging dimension, Lasso, selection consistency, Variable selection, stability, 62H30
Hao Wang, Sophia Zhengzi Li
Electron. J. Statist. 6, 168-198, (2012) DOI: 10.1214/12-EJS669
KEYWORDS: Exchange algorithms, Gaussian graphical models, G-Wishart, Hyper-inverse Wishart, Gibbs sampler, non-decomposable graphs, partial analytic structure, posterior simulation
Jonathan Huang, Carlos Guestrin
Electron. J. Statist. 6, 199-230, (2012) DOI: 10.1214/12-EJS670
KEYWORDS: Riffled independence, permutations, rankings, structure learning, group theoretic methods, Probabilistic modeling, 68T37, 60C05, 60B15
Klaus Frick, Philipp Marnitz, Axel Munk
Electron. J. Statist. 6, 231-268, (2012) DOI: 10.1214/12-EJS671
KEYWORDS: alternating direction method of multipliers (ADMM), biophotonics, Dantzig selector, Dykstra’s projection algorithm, local adaption, signal detection, statistical imaging, statistical multiscale analysis, statistical regularization, 62G05, 90C06, 68U10
Daniel Percival
Electron. J. Statist. 6, 269-288, (2012) DOI: 10.1214/12-EJS672
KEYWORDS: Sparsity, Variable selection, structured sparsity, regularized methods
Kwun Chuen Gary Chan
Electron. J. Statist. 6, 289-302, (2012) DOI: 10.1214/12-EJS673
KEYWORDS: Auxiliary information, double robustness, empirical likelihood, missing data, survey calibration
Jean-François Coeurjolly, Hedi Kortas
Electron. J. Statist. 6, 303-322, (2012) DOI: 10.1214/12-EJS674
KEYWORDS: expectiles, robustness, local shift sensitivity, subordinated Gaussian process, fractional Brownian motion, 60G18, 62G30
Timothy W. Randolph, Jaroslaw Harezlak, Ziding Feng
Electron. J. Statist. 6, 323-353, (2012) DOI: 10.1214/12-EJS676
KEYWORDS: penalized regression, generalized singular value decomposition, regularization, functional data, 62J05, 62J07, 65F22
B.J.K. Kleijn, A.W. van der Vaart
Electron. J. Statist. 6, 354-381, (2012) DOI: 10.1214/12-EJS675
KEYWORDS: misspecification, posterior distribution, Credible set, limit distribution, rate of convergence, consistency, 62F15, 62F25, 62F12
Jean-Baptiste Monnier
Electron. J. Statist. 6, 382-420, (2012) DOI: 10.1214/12-EJS677
KEYWORDS: Nonparametric regression, random design, multi-resolution analysis, supervised binary classification, margin assumption, 62G05, 62G08, 62H30, 62H12
Artur J. Lemonte, Silvia L.P. Ferrari
Electron. J. Statist. 6, 421-434, (2012) DOI: 10.1214/12-EJS678
KEYWORDS: asymptotic expansions, gradient test, likelihood ratio test, local power, score test, Wald test
Jean-Marc Bardet, William Kengne, Olivier Wintenberger
Electron. J. Statist. 6, 435-477, (2012) DOI: 10.1214/12-EJS680
KEYWORDS: change detection, causal processes, ARCH(∞) processes, AR(∞) processes, quasi-maximum likelihood estimator, model selection by penalized likelihood, 62M10, 62F12
Alexander Aue, Thomas C. M. Lee, Haonan Wang
Electron. J. Statist. 6, 478-500, (2012) DOI: 10.1214/12-EJS682
KEYWORDS: Bandwidth function, break point detection, local linear regression, optimal bandwidth, 62G08
Carla Moreira, Jacobo de Uña-Álvarez
Electron. J. Statist. 6, 501-521, (2012) DOI: 10.1214/12-EJS683
KEYWORDS: Biased sampling, double truncation, semiparametric estimator, smoothing methods, 62G07, 62N02
Stéphane Gaïffas, Agathe Guilloux
Electron. J. Statist. 6, 522-546, (2012) DOI: 10.1214/12-EJS681
KEYWORDS: Survival analysis, counting processes, Censored data, Aalen additive model, Lasso, High-dimensional covariates, data-driven Bernstein’s inequality, 62N02, 62H12
Ery Arias-Castro
Electron. J. Statist. 6, 547-558, (2012) DOI: 10.1214/12-EJS686
KEYWORDS: signal detection, compressed sensing, adaptive measurements, normal mean model, Sparsity, High-dimensional data, 62C20, 62G10, 62H15
Jiawei Bai, Jeff Goldsmith, Brian Caffo, Thomas A. Glass, Ciprian M. Crainiceanu
Electron. J. Statist. 6, 559-578, (2012) DOI: 10.1214/12-EJS684
KEYWORDS: Accelerometer, Matching, time series, physical activity, 62P10, 68T10
Adrien Saumard
Electron. J. Statist. 6, 579-655, (2012) DOI: 10.1214/12-EJS679
KEYWORDS: Least-squares regression, Heteroscedasticity, excess risk, lower bounds, sup-norm, localized basis, empirical process
ChangJiang Xu, A. Ian McLeod
Electron. J. Statist. 6, 656-663, (2012) DOI: 10.1214/12-EJS685
KEYWORDS: Variable selection, Model selection, information criterion, consistency, 62J02, 62J12
Stefan Ralescu
Electron. J. Statist. 6, 664-671, (2012) DOI: 10.1214/12-EJS687
KEYWORDS: Bahadur representation, asymptotic normality, U-statistics, Kernel estimator, 60K35
Paul Kabaila, Dilshani Tissera
Electron. J. Statist. 6, 672-685, (2012) DOI: 10.1214/12-EJS688
KEYWORDS: case-control study, coverage probability, odds ratio, simultaneous confidence intervals, test of homogeneity, 62F25, 62P10
David R. Bickel
Electron. J. Statist. 6, 686-709, (2012) DOI: 10.1214/12-EJS689
KEYWORDS: ambiguity, blended inference, conditional Gamma-minimax, confidence distribution, confidence posterior, Ellsberg paradox, imprecise probability, maximum entropy, maxmin expected utility, minimum cross entropy, minimum divergence, minimum information for discrimination, minimum relative entropy, observed confidence level, robust Bayesian analysis, 62A01, 62A99
Yanyuan Ma, Yuanjia Wang
Electron. J. Statist. 6, 710-737, (2012) DOI: 10.1214/12-EJS690
KEYWORDS: Finite mixed samples, robustness, Semiparametric efficiency, nonparametric maximum likelihood estimator (NPMLE), 62G05, 62G20, 62G99
Frank Konietschke, Ludwig A. Hothorn, Edgar Brunner
Electron. J. Statist. 6, 738-759, (2012) DOI: 10.1214/12-EJS691
KEYWORDS: rank statistics, Multiple comparisons, nonparametric Behrens-Fisher problem
Shojaeddin Chenouri, Christopher G. Small
Electron. J. Statist. 6, 760-782, (2012) DOI: 10.1214/12-EJS692
KEYWORDS: data depth, multivariate nonparametric tests, Kruskal-Wallis test, depth-depth plot
Dominique Fourdrinier, Fatiha Mezoued, William E. Strawderman
Electron. J. Statist. 6, 783-809, (2012) DOI: 10.1214/12-EJS694
KEYWORDS: Bayes estimators, minimax estimators, spherically symmetric distributions, location parameter, quadratic loss, superharmonic priors, Sobolev Spaces, 62C10, 62C20, 46E35
Randy C. S. Lai, Hsin-Cheng Huang, Thomas C. M. Lee
Electron. J. Statist. 6, 810-842, (2012) DOI: 10.1214/12-EJS695
KEYWORDS: adaptive group LASSO, additive mixed model, Bayesian Information Criterion, consistency, 62G08
Dimitrios Bagkavos, Dimitrios Ioannides
Electron. J. Statist. 6, 843-860, (2012) DOI: 10.1214/12-EJS697
KEYWORDS: survival function, Confidence interval, Censoring, ‎kernel‎, 62G05, 62N02
Nora Serdyukova
Electron. J. Statist. 6, 861-907, (2012) DOI: 10.1214/12-EJS693
KEYWORDS: adaptive estimation, heteroscedastic data, Nonparametric regression, Lepski’s method, minimax rate of convergence, model misspecification, Nonparametric regression, Oracle inequalities, propagation, 62G05, 62G08
Etienne Birmelé
Electron. J. Statist. 6, 908-933, (2012) DOI: 10.1214/12-EJS698
KEYWORDS: Network motif, Poisson approximation, biological network, 62P10, 05C90
Fumiyasu Komaki
Electron. J. Statist. 6, 934-957, (2012) DOI: 10.1214/12-EJS700
KEYWORDS: Dirichlet prior, Jeffreys prior, Kullback-Leibler divergence, latent information prior, reference prior, 62C10, 62C20, 62F15
Clayton Scott
Electron. J. Statist. 6, 958-992, (2012) DOI: 10.1214/12-EJS699
KEYWORDS: surrogate loss, classification calibrated, cost-sensitive classification, imbalanced data, uneven margin, excess risk bound
Elizabeth Gross, Mathias Drton, Sonja Petrović
Electron. J. Statist. 6, 993-1016, (2012) DOI: 10.1214/12-EJS702
KEYWORDS: Analysis of variance, linear mixed model, maximum likelihood, restricted maximum likelihood, variance component, 62J10, 62F10
Haiying Wang, Guohua Zou, Alan T. K. Wan
Electron. J. Statist. 6, 1017-1039, (2012) DOI: 10.1214/12-EJS704
KEYWORDS: ‎asymptotic ‎equivalence, Measurement errors, model averaging, Model selection, semi-parametric models, 62E20, 62F10, 62F12
Guo-Liang Fan, Hong-Xia Xu, Han-Ying Liang
Electron. J. Statist. 6, 1040-1058, (2012) DOI: 10.1214/12-EJS701
KEYWORDS: Time-varying coefficient model, Errors-in-variables model, empirical likelihood, confidence region, $\alpha $-mixing, 62G15, 62E20
Antoine Chambaz, Pierre Neuvial, Mark J. van der Laan
Electron. J. Statist. 6, 1059-1099, (2012) DOI: 10.1214/12-EJS703
KEYWORDS: Variable importance measure, Non-parametric estimation, targeted minimum loss estimation, robustness, asymptotics, 62G05, 62G20, 62G35, 62P10
Pavel N. Krivitsky
Electron. J. Statist. 6, 1100-1128, (2012) DOI: 10.1214/12-EJS696
KEYWORDS: p-star model, transitivity, weighted network, count data, maximum likelihood estimation, Conway–Maxwell–Poisson distribution, 91D30, 60B05
Olivier Collier
Electron. J. Statist. 6, 1129-1154, (2012) DOI: 10.1214/12-EJS706
KEYWORDS: Adaptive testing, Composite null hypothesis, generalized maximum likelihood, minimax hypothesis testing
Adrian Baddeley, Gopalan Nair
Electron. J. Statist. 6, 1155-1169, (2012) DOI: 10.1214/12-EJS707
KEYWORDS: Georgii-Nguyen-Zessin formula, Gibbs point process, Lambert $W$ function, mean field approximation, pairwise interaction point process, Palm distribution, Papangelou conditional intensity, Percus-Yevick approximation, Poisson approximation, Poisson-saddlepoint approximation, Strauss process, 60G55, 82B21, 62E17
Minh-Ngoc Tran, David J. Nott, Robert Kohn
Electron. J. Statist. 6, 1170-1199, (2012) DOI: 10.1214/12-EJS705
KEYWORDS: Bayesian model selection, Heteroscedasticity, mixture of normals, variational approximation, 62G07, 62G08
Ursula U. Müller, Ingrid Van Keilegom
Electron. J. Statist. 6, 1200-1219, (2012) DOI: 10.1214/12-EJS708
KEYWORDS: efficiency, influence function, missing at random, Nonlinear regression, nuisance function, parametric regression, Quantile regression, quasi-likelihood regression, 62F12, 62G05, 62J02
Hohsuk Noh, Kwanghun Chung, Ingrid Van Keilegom
Electron. J. Statist. 6, 1220-1238, (2012) DOI: 10.1214/12-EJS709
KEYWORDS: Basis approximation, consistency in variable selection, second order cone programming, shrinkage estimator, 62G35, 62J07
Frank Huettner, Marco Sunder
Electron. J. Statist. 6, 1239-1250, (2012) DOI: 10.1214/12-EJS710
KEYWORDS: Shapley value, Owen value, variance decomposition, regression games, GSOEP, 62J05, 62P20, 91A12
Agnès Hamon, Bernard Ycart
Electron. J. Statist. 6, 1251-1272, (2012) DOI: 10.1214/12-EJS711
KEYWORDS: Luria-Delbrück distribution, fluctuation analysis, Bellman-Harris branching process, probability generating function estimator, 92D25, 60J28
Irène Gijbels, Marek Omelka, Noël Veraverbeke
Electron. J. Statist. 6, 1273-1306, (2012) DOI: 10.1214/12-EJS712
KEYWORDS: Asymptotic representation, empirical copula process, functional covariates, multivariate covariates, Small ball probability, random design, smoothing, 62G05, 62H20, 62G20
Tristan Launay, Anne Philippe, Sophie Lamarche
Electron. J. Statist. 6, 1307-1357, (2012) DOI: 10.1214/12-EJS713
KEYWORDS: Bayesian asymptotic, Bernstein-von Mises theorem, maximum-likelihood estimation, non-regular model, piecewise regression
Frank Konietschke, Markus Pauly
Electron. J. Statist. 6, 1358-1372, (2012) DOI: 10.1214/12-EJS714
KEYWORDS: confidence intervals, Heteroscedasticity, matched pairs, nonparametric Behrens-Fisher problem, rank statistics, Resampling
Heng Lian
Electron. J. Statist. 6, 1373-1391, (2012) DOI: 10.1214/12-EJS716
KEYWORDS: Bernstein’s inequality for martingale differences, Nadaraya-Watson estimate, nearest neighbor estimate, nonparametric functional regression, Orlicz norm, 62G08, 60G10
Jacques Istas
Electron. J. Statist. 6, 1392-1408, (2012) DOI: 10.1214/12-EJS717
KEYWORDS: self-similarity, complex variations, $H$-sssi processes, 60G18, 60G15, 60G52
Ghislaine Gayraud, Yuri Ingster
Electron. J. Statist. 6, 1409-1448, (2012) DOI: 10.1214/12-EJS715
KEYWORDS: High-dimensional setting, Sparsity, asymptotic minimax approach, Detection boundary, Gaussian white noise model, 62H15, 60G15, 62G10, 62G20, 60C20
Katherine F. Davies, B. Gail Ivanoff
Electron. J. Statist. 6, 1449-1476, (2012) DOI: 10.1214/12-EJS718
KEYWORDS: point process, Renewal process, avoidance probability, multiparameter martingale, product limit estimator, 60K05, 62G05, 62M30, 60G55
Anton Grafström, Lionel Qualité, Yves Tillé, Alina Matei
Electron. J. Statist. 6, 1477-1489, (2012) DOI: 10.1214/12-EJS719
KEYWORDS: survey sampling, maximum entropy, splitting method, 62D05
Adam D. Bull
Electron. J. Statist. 6, 1490-1516, (2012) DOI: 10.1214/12-EJS720
KEYWORDS: nonparametric statistics, Adaptation, Confidence sets, supremum norm, self-similar functions, 62G15, 62G07, 62G08, 62G20
Guido Masarotto, Cristiano Varin
Electron. J. Statist. 6, 1517-1549, (2012) DOI: 10.1214/12-EJS721
KEYWORDS: discrete time series, Gaussian copula, generalized estimating equations, likelihood inference, longitudinal data, marginal regression, multivariate probit, spatial data, survival data
Bharath K. Sriperumbudur, Kenji Fukumizu, Arthur Gretton, Bernhard Schölkopf, Gert R. G. Lanckriet
Electron. J. Statist. 6, 1550-1599, (2012) DOI: 10.1214/12-EJS722
KEYWORDS: Integral probability metrics, empirical estimation, Kantorovich metric, dual-bounded Lipschitz distance (Dudley metric), kernel distance, ‎reproducing kernel Hilbert ‎space, Rademacher average, Lipschitz classifier, Support Vector Machine, 62G05
Parikshit Shah, Venkat Chandrasekaran
Electron. J. Statist. 6, 1600-1640, (2012) DOI: 10.1214/12-EJS723
KEYWORDS: group invariance, covariance selection, exchangeability, high dimensional asymptotics, 62F12, 62H12
Giorgio Russolillo
Electron. J. Statist. 6, 1641-1669, (2012) DOI: 10.1214/12-EJS724
KEYWORDS: Optimal scaling, NIPALS, PLS Regression, PLS Path Modeling, non-linearity, 62-07, 62H25
Cornelia Wichelhaus, Roland Langrock
Electron. J. Statist. 6, 1670-1714, (2012) DOI: 10.1214/12-EJS725
KEYWORDS: cross-spectral analysis, Multivariate point processes, nonparametric statistics for queues, periodogram, Self-exciting processes, tandem networks, 60G55, 62M15, 60K25
Laurent Gardes, Stéphane Girard
Electron. J. Statist. 6, 1715-1744, (2012) DOI: 10.1214/12-EJS727
KEYWORDS: conditional quantiles, heavy-tailed distributions, functional kernel estimator, extreme-value theory, 62G32, 62G30, 62E20
André Mas
Electron. J. Statist. 6, 1745-1778, (2012) DOI: 10.1214/12-EJS726
KEYWORDS: functional data, small ball problems, Nonparametric regression, regular variation, Gaussian random elements, lower bound, 62G08, 60K35, 62G20
Stefan Aulbach, Michael Falk
Electron. J. Statist. 6, 1779-1802, (2012) DOI: 10.1214/12-EJS728
KEYWORDS: Functional extreme value theory, generalized Pareto process, Max-stable process, point process of exceedances, local asymptotic normality, central sequence, asymptotic optimal test sequence, Asymptotic relative efficiency, 62F05, 60G70, 62G32
Guillaume Lecué, Charles Mitchell
Electron. J. Statist. 6, 1803-1837, (2012) DOI: 10.1214/12-EJS730
KEYWORDS: Adaptation, Aggregation, cross-validation, Sparsity, 62G99
Hua Liang, Pang Du
Electron. J. Statist. 6, 1838-1846, (2012) DOI: 10.1214/12-EJS731
KEYWORDS: high dimensional, asymptotic normality, injective function, “large $n$, diverging $p$”, logistic regression, 62F12, 62J12
Alain Celisse, Jean-Jacques Daudin, Laurent Pierre
Electron. J. Statist. 6, 1847-1899, (2012) DOI: 10.1214/12-EJS729
KEYWORDS: Random graphs, Stochastic block model, maximum likelihood estimators, variational estimators, consistency, Concentration inequalities, 62G05, 62G20, 62E17, 62H30
C. J. Brien, R. A. Bailey, T. T. Tran, J. Boland
Electron. J. Statist. 6, 1900-1925, (2012) DOI: 10.1214/12-EJS732
KEYWORDS: Design of experiments, Factorial designs, glasshouse experiments, latinized designs, quasi-Latin designs, row-column designs, 62J10, 62K99
Davide Pigoli, Piercesare Secchi
Electron. J. Statist. 6, 1926-1942, (2012) DOI: 10.1214/12-EJS733
KEYWORDS: Non Euclidean data, semivariogram, Fréchet mean, meteorological data, 62H11, 62H12
Jan Hannig, Min-ge Xie
Electron. J. Statist. 6, 1943-1966, (2012) DOI: 10.1214/12-EJS734
KEYWORDS: confidence distribution, Dempster-Shafer calculus, generalized fiducial inference, meta analysis, 62A01, 62F99
Helène Boistard, Hendrik P. Lopuhaä, Anne Ruiz-Gazen
Electron. J. Statist. 6, 1967-1983, (2012) DOI: 10.1214/12-EJS736
KEYWORDS: rejective sampling, Poisson sampling, Edgeworth expansions, maximal entropy, Hermite polynomials, 62D05, 60E10
R. de Jonge, J.H. van Zanten
Electron. J. Statist. 6, 1984-2001, (2012) DOI: 10.1214/12-EJS735
KEYWORDS: Nonparametric Bayes procedure, tensor-product splines, Posterior contraction rate, adaptive estimation, 62C10, 62G20
Fabienne Comte, Tabea Rebafka
Electron. J. Statist. 6, 2002-2037, (2012) DOI: 10.1214/12-EJS737
KEYWORDS: adaptive nonparametric estimation, Biased data, Deconvolution, fluorescence lifetimes, projection estimator, 62G07, 62N01
George Karabatsos, Stephen G. Walker
Electron. J. Statist. 6, 2038-2068, (2012) DOI: 10.1214/12-EJS738
KEYWORDS: Bayesian inference, Nonparametric regression, unimodal distribution, binary regression
Mladen Kolar, Eric P. Xing
Electron. J. Statist. 6, 2069-2106, (2012) DOI: 10.1214/12-EJS739
KEYWORDS: Gaussian graphical models, network models, dynamic network models, structural changes, 62G05, 62G20
Paul Gustafson
Electron. J. Statist. 6, 2107-2124, (2012) DOI: 10.1214/12-EJS741
KEYWORDS: Bayesian inference, credible interval, partial identification
Rahul Mazumder, Trevor Hastie
Electron. J. Statist. 6, 2125-2149, (2012) DOI: 10.1214/12-EJS740
KEYWORDS: graphical lasso, sparse inverse covariance selection, precision matrix, convex analysis/optimization, positive definite matrices, Sparsity, semidefinite programming, 62H99, 62-09, 62-04
Mikhail Ermakov
Electron. J. Statist. 6, 2150-2184, (2012) DOI: 10.1214/12-EJS742
KEYWORDS: Asymptotic efficiency, Confidence estimation, large deviations, 62F10, 62F25
Eckhard Schlemm, Robert Stelzer
Electron. J. Statist. 6, 2185-2234, (2012) DOI: 10.1214/12-EJS743
KEYWORDS: asymptotic normality, linear state space model, multivariate CARMA process, quasi maximum likelihood estimation, strong consistency, Strong mixing, 62F10, 62F12, 62M09, 60G51, 60G10
Jun Zhang, Tao Wang, Lixing Zhu, Hua Liang
Electron. J. Statist. 6, 2235-2273, (2012) DOI: 10.1214/12-EJS744
KEYWORDS: Coordinate-independent sparse estimation (CISE), cumulative slicing estimation, high-dimensional covariate, inverse regression, inverse regression, partially linear models, profile likelihood, sufficient dimension reduction, 62G08, 62G20, 62J02, 62F12
S. Delattre, M. Hoffmann, D. Picard, T. Vareschi
Electron. J. Statist. 6, 2274-2308, (2012) DOI: 10.1214/12-EJS745
KEYWORDS: Blind deconvolution, blockwise SVD, circular and spherical deconvolution, Nonparametric adaptive estimation, linear inverse problems, error in the operator, 62G05, 62G99, 65J20, 65J22
Yuan Cheng, Alex Lenkoski
Electron. J. Statist. 6, 2309-2331, (2012) DOI: 10.1214/12-EJS746
KEYWORDS: Gaussian graphical models, G-Wishart distribution, conditional Bayes factors, Exchange algorithms
Ming-Xiang Cao
Electron. J. Statist. 6, 2332-2346, (2012) DOI: 10.1214/12-EJS747
KEYWORDS: Balanced loss function, Linear estimators, stochastic regression coefficients, $\Phi$ optimality, $\Phi$ admissibility, 62C15, 62J12
Reman Abu-Shanab, John T. Kent, William E. Strawderman
Electron. J. Statist. 6, 2347-2355, (2012) DOI: 10.1214/12-EJS748
KEYWORDS: James-Stein estimator, matrix quadratic loss function, risk, Stein’s lemma, 62C99, 62H12
Wicher Bergsma, Marcel Croon, L. Andries van der Ark
Electron. J. Statist. 6, 2356-2361, (2012) DOI: 10.1214/12-EJS750
KEYWORDS: empirical likelihood, empty set problem, zero likelihood problem, marginal model, optimization with constraints, 62G05, 62G10, 62H12, 62H15, 62H17
María Jesús Rufo, Carlos J. Pérez, Jacinto Martín
Electron. J. Statist. 6, 2362-2382, (2012) DOI: 10.1214/12-EJS752
KEYWORDS: Bayesian analysis, group decision, Kullback-Leibler divergence, multivariate exponential families, opinion pooling, 62C10, 62H99
Jean-Marc Bardet, Hatem Bibi
Electron. J. Statist. 6, 2383-2419, (2012) DOI: 10.1214/12-EJS754
KEYWORDS: Long range dependence, linear processes, wavelet estimator, semiparametric estimator, Adaptive estimator, adaptive goodness-of-fit test, 62M07, 62M09, 62M10, 62M15, 60F05
Gaelle Chastaing, Fabrice Gamboa, Clémentine Prieur
Electron. J. Statist. 6, 2420-2448, (2012) DOI: 10.1214/12-EJS749
KEYWORDS: Sensitivity index, Hoeffding decomposition, dependent variables, Sobol decomposition
Chris J. Lloyd
Electron. J. Statist. 6, 2449-2462, (2012) DOI: 10.1214/12-EJS751
KEYWORDS: bootstrap, exact test, exact P-value, nuisance parameters, size accuracy, 62F03, 62F05
Vivekananda Roy
Electron. J. Statist. 6, 2463-2485, (2012) DOI: 10.1214/12-EJS756
KEYWORDS: convergence rate, Data augmentation algorithm, geometric ergodicity, Markov chain, robit regression, robust regression, 60J27, 62F15
Jakob Söhl, Mathias Trabs
Electron. J. Statist. 6, 2486-2518, (2012) DOI: 10.1214/12-EJS757
KEYWORDS: Deconvolution, Donsker Theorem, efficiency, distribution function, smoothed empirical processes, Fourier multipliers, 62G05, 60F05
Hohsuk Noh, Ingrid Van Keilegom
Electron. J. Statist. 6, 2519-2534, (2012) DOI: 10.1214/12-EJS762
KEYWORDS: Bayesian Information Criterion, boundary problem, local polynomial estimator, Variable selection, 62G08, 62G20
Hervé Cardot, Peggy Cénac, Pierre-André Zitt
Electron. J. Statist. 6, 2535-2562, (2012) DOI: 10.1214/12-EJS759
KEYWORDS: Robbins–Monro, asymptotic normality, averaging, central limit theorem, kernel regression, Mallows–Wasserstein distance, online data, robust estimator, sequential estimation, stochastic gradient, 62L20, 60F05
Ubaldo Garibaldi, Paolo Viarengo
Electron. J. Statist. 6, 2563-2573, (2012) DOI: 10.1214/12-EJS755
KEYWORDS: Censored data, predictive inference, 62N01, 62N02
Antoine Channarond, Jean-Jacques Daudin, Stéphane Robin
Electron. J. Statist. 6, 2574-2601, (2012) DOI: 10.1214/12-EJS753
KEYWORDS: stochastic blockmodel, unsupervised classification, clustering, estimation, Model selection, 62H30, 62H12
Alessio Farcomeni, Luca Tardella
Electron. J. Statist. 6, 2602-2626, (2012) DOI: 10.1214/12-EJS758
KEYWORDS: Binomial mixture, capture-recapture, Identifiability, conditional likelihood, complete likelihood, unconditional likelihood, 62G10, 62F12
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