Christopher Withers, Saralees Nadarajah
Electron. J. Statist. 4, 1-14, (2010) DOI: 10.1214/09-EJS447
KEYWORDS: bias reduction, M-estimates, non-linear, regression, robust, skewness, 62G08, 62G20
B. Gail Ivanoff, N.C. Weber
Electron. J. Statist. 4, 15-35, (2010) DOI: 10.1214/09-EJS533
KEYWORDS: Causal stationary processes, Empirical distribution function, spatial ARMA processes, central limit theorem, quantile process, martingale, 62G30, 60F17, 62M10, 60G60
Alexander Meister, Ulrich Stadtmüller, Christian Wagner
Electron. J. Statist. 4, 36-57, (2010) DOI: 10.1214/09-EJS444
KEYWORDS: Hermite polynomials, Measurement errors, Minimax convergence rates, nonparametric statistics, Statistical inverse problems, 62G07
Bowei Xi, Hui Chen, William S. Cleveland, Thomas Telkamp
Electron. J. Statist. 4, 58-116, (2010) DOI: 10.1214/09-EJS473
KEYWORDS: Statistical model building, very large datasets, semi-empirical models, long-range dependence, 62P30, 62-07, 62M10, 62M15
Zohra Guessoum, Elias Ould Saïd
Electron. J. Statist. 4, 117-132, (2010) DOI: 10.1214/08-EJS195
KEYWORDS: Censored data, Kernel estimator, Nonparametric regression, rate of convergence, strong consistency, Strong mixing, 62G05, 62G20
Ingrid Van Keilegom, Lan Wang
Electron. J. Statist. 4, 133-160, (2010) DOI: 10.1214/09-EJS547
KEYWORDS: Dispersion function, Heteroscedasticity, partially linear model, Quantile regression, semiparametric regression, Single-index model, variance function
Christopher Withers, Saralees Nadarajah
Electron. J. Statist. 4, 161-171, (2010) DOI: 10.1214/10-EJS562
KEYWORDS: asymptotic, Confidence regions, distribution-free, estimates, influence function, multivariate normal, stabilizing, 62G08, 62G20
Patricia Reynaud-Bouret, Vincent Rivoirard
Electron. J. Statist. 4, 172-238, (2010) DOI: 10.1214/08-EJS319
KEYWORDS: adaptive estimation, Calibration, Model selection, Oracle inequalities, Poisson process, thresholding rule, 62G05, 62G20
Heng Lian
Electron. J. Statist. 4, 239-253, (2010) DOI: 10.1214/09-EJS477
KEYWORDS: Change-point problems, posterior distribution, rate of convergence, 62G20, 62G08
Madeleine Cule, Richard Samworth
Electron. J. Statist. 4, 254-270, (2010) DOI: 10.1214/09-EJS505
KEYWORDS: consistency, Log-concavity, Kullback–Leibler divergence, maximum likelihood estimation, model misspecification, 62G07, 62G20
Zhiyi Chi
Electron. J. Statist. 4, 271-299, (2010) DOI: 10.1214/08-EJS318
KEYWORDS: multiple testing, composite null, p-value, empirical process, FDR, stopping time, DKW inequality, 62G10, 62H15, 62G20
Paul Kabaila, Khageswor Giri, Hannes Leeb
Electron. J. Statist. 4, 300-312, (2010) DOI: 10.1214/10-EJS563
KEYWORDS: Admissibility, compromise decision theory, Confidence interval, decision theory, 62C15, 62J05
Alicia A. Johnson, Galin L. Jones
Electron. J. Statist. 4, 313-333, (2010) DOI: 10.1214/09-EJS515
KEYWORDS: Gibbs sampler, convergence rate, drift condition, General linear model, geometric ergodicity, Markov chain, Monte Carlo
Benedikt M. Pötscher, Ulrike Schneider
Electron. J. Statist. 4, 334-360, (2010) DOI: 10.1214/09-EJS523
KEYWORDS: penalized maximum likelihood, penalized least squares, Lasso, Adaptive LASSO, hard-thresholding, soft-thresholding, confidence set, coverage probability, Sparsity, Model selection, 62F25, 62C25, 62J07
Dorota Gajda, Chantal Guihenneuc-Jouyaux, Judith Rousseau, Kerry Mengersen, Darfiana Nur
Electron. J. Statist. 4, 361-383, (2010) DOI: 10.1214/09-EJS527
KEYWORDS: MCMC, importance sampling, Poisson model, 62F15, 65C05, 65C60
Francis Bach
Electron. J. Statist. 4, 384-414, (2010) DOI: 10.1214/09-EJS521
Christophe Chesneau, Jalal Fadili, Jean-Luc Starck
Electron. J. Statist. 4, 415-435, (2010) DOI: 10.1214/09-EJS550
KEYWORDS: Image deconvolution, block thresholding, Wavelets, minimax, LaTeX2e, 62M10, 62F12, 62F12
Benoît Cadre, Qian Dong
Electron. J. Statist. 4, 436-460, (2010) DOI: 10.1214/09-EJS559
KEYWORDS: Dimension reduction, Central mean subspace, nearest neighbor method, semiparametric regression, SIR method, 62H12, 62G08
Werner Ehm, Jürgen Kornmeier, Sven P. Heinrich
Electron. J. Statist. 4, 461-471, (2010) DOI: 10.1214/09-EJS496
KEYWORDS: Conquer and Divide, event-related potentials, familywise error, (nested) multiple testing, tree of hypotheses, 62G10, 62J15, 62L99
Wenge Guo, M. Bhaskara Rao
Electron. J. Statist. 4, 472-485, (2010) DOI: 10.1214/08-EJS320
KEYWORDS: closure principle, generalized familywise error rate, Hommel procedure, multiple testing, P-values, stepup procedure, 62J15, 62G10
Laura Dumitrescu
Electron. J. Statist. 4, 486-524, (2010) DOI: 10.1214/09-EJS503
KEYWORDS: Measurement errors, longitudinal data, central limit theorems, generalized domain of attraction of the normal law, 62H12, 62J99, 60F05, 60E07
Hiroki Masuda
Electron. J. Statist. 4, 525-565, (2010) DOI: 10.1214/10-EJS565
KEYWORDS: Discrete-time sampling, Lévy process, Ornstein-Uhlenbeck process, self-weighted LAD estimation, 62M05
Guy Lebanon, Yang Zhao, Yanjun Zhao
Electron. J. Statist. 4, 566-584, (2010) DOI: 10.1214/09-EJS522
KEYWORDS: kernel smoothing, text modeling, 62G99, 62P99
Steve Hanneke, Wenjie Fu, Eric P. Xing
Electron. J. Statist. 4, 585-605, (2010) DOI: 10.1214/09-EJS548
Emmanuel Sharef, Robert L. Strawderman, David Ruppert, Mark Cowen, Lakshmi Halasyamani
Electron. J. Statist. 4, 606-642, (2010) DOI: 10.1214/10-EJS566
KEYWORDS: Survival analysis, knot selection, Hazard regression, frailty distribution, random effect density, reversible-jump MCMC, heart failure, re-hospitalization
Jean-Michel Marin, Christian P. Robert
Electron. J. Statist. 4, 643-654, (2010) DOI: 10.1214/10-EJS564
KEYWORDS: Bayesian model choice, Bayes factor, bridge sampling, conditional distribution, Hypothesis testing, Savage–Dickey ratio, zero measure set
Robin Girard
Electron. J. Statist. 4, 655-676, (2010) DOI: 10.1214/10-EJS567
KEYWORDS: segmentation, mixture model, penalized maximum likelihood estimation, dimensionality reduction, 60K35
Jean-François Coeurjolly, Rémy Drouilhet
Electron. J. Statist. 4, 677-706, (2010) DOI: 10.1214/09-EJS494
KEYWORDS: Stationary Gibbs point processes, Maximum pseudo-likelihood estimator, Lennard-Jones model, 60G55, 60J25
Umberto Amato, Anestis Antoniadis, Alexander Samarov, Alexandre B. Tsybakov
Electron. J. Statist. 4, 707-736, (2010) DOI: 10.1214/09-EJS498
KEYWORDS: Nonparametric density estimation, independent factor analysis, Aggregation, plug-in classifier, remote sensing, 62H25, 62G07, 62H30
Bertrand Clarke, Subhashis Ghosal
Electron. J. Statist. 4, 737-780, (2010) DOI: 10.1214/10-EJS569
KEYWORDS: objective prior, posterior normality, mutual information, increasing dimension, exponential family, 62F15, 62C10
Axel Munk, Johannes Schmidt-Hieber
Electron. J. Statist. 4, 781-821, (2010) DOI: 10.1214/10-EJS568
KEYWORDS: Brownian motion, variance estimation, Minimax rate, microstructure noise, Sobolev embedding, 62M09, 62M10, 62G08, 62G20
Jérémie Bigot, Rolando Biscay, Jean-Michel Loubes, Lilian Muñiz-Alvarez
Electron. J. Statist. 4, 822-855, (2010) DOI: 10.1214/09-EJS493
KEYWORDS: Covariance estimation, Model selection, Oracle inequality, 62G05, 62G20
Robert L. Paige, A. Alexandre Trindade
Electron. J. Statist. 4, 856-874, (2010) DOI: 10.1214/10-EJS570
KEYWORDS: Semiparametric model, parametric bootstrap confidence interval, saddlepoint approximation, econometric smoothing, gross national product, 62F25, 62G09
Justin Wishart, Rafał Kulik
Electron. J. Statist. 4, 875-913, (2010) DOI: 10.1214/10-EJS571
KEYWORDS: change point, kink, high-order kernel, zero-crossing technique, long-range dependence, random design, separation rate lemma, 62G08, 62G05, 62G20
Junhui Wang, Lifeng Wang
Electron. J. Statist. 4, 914-931, (2010) DOI: 10.1214/10-EJS572
KEYWORDS: Dimension reduction, SAVE, SIR, large-p-small-n, Support Vector Machine, tuning, 62H30
Felix Abramovich, Vadim Grinshtein
Electron. J. Statist. 4, 932-949, (2010) DOI: 10.1214/10-EJS573
KEYWORDS: Adaptivity, complexity penalty, Gaussian linear regression, maximum a posteriori rule, minimax estimation, Model selection, Oracle inequality, Sparsity, 62C99, 62C10, 62C20, 62G05
Pierre L’Ecuyer, David Munger, Bruno Tuffin
Electron. J. Statist. 4, 950-993, (2010) DOI: 10.1214/10-EJS574
KEYWORDS: quasi-Monte Carlo, lattice rule, integration error, limit theorem, Confidence interval, 62E20, 60F05
Jérémie Bigot, Sébastien Gadat, Clément Marteau
Electron. J. Statist. 4, 994-1021, (2010) DOI: 10.1214/10-EJS576
KEYWORDS: Template estimation, Curve alignment, inverse problem, Oracle inequality, adaptive estimation, random operator, 62G07, ‎42C40, 41A29
Sonja Greven, Ciprian Crainiceanu, Brian Caffo, Daniel Reich
Electron. J. Statist. 4, 1022-1054, (2010) DOI: 10.1214/10-EJS575
KEYWORDS: Diffusion tensor imaging, Functional data analysis, Karhunen-Loève expansion, longitudinal data analysis, Mixed effects model
Yiyuan She
Electron. J. Statist. 4, 1055-1096, (2010) DOI: 10.1214/10-EJS578
KEYWORDS: Sparsity, clustering, thresholding, Lasso, 62J07, 62H30
Ioannis Kosmidis, David Firth
Electron. J. Statist. 4, 1097-1112, (2010) DOI: 10.1214/10-EJS579
KEYWORDS: Adjusted score, asymptotic bias correction, Beta regression, bias reduction, fisher scoring, prater gasoline data, 62F10, 62F12, 62F05
Nicolas Verzelen
Electron. J. Statist. 4, 1113-1150, (2010) DOI: 10.1214/10-EJS580
KEYWORDS: Covariance matrix, banding, Cholesky decomposition, directed graphical models, penalized criterion, minimax rate of estimation, 62H12, 62F35, 62J05
A. Baddeley, M. Berman, N.I. Fisher, A. Hardegen, R.K. Milne, D. Schuhmacher, R. Shah, R. Turner
Electron. J. Statist. 4, 1151-1201, (2010) DOI: 10.1214/10-EJS581
KEYWORDS: Change of support, complementary log-log regression, ecological fallacy, exponential family, generalized linear models, geographical information systems, likelihood, logistic regression, missing information principle, mixed pixels, mixels, modifiable area unit problem, modulated Poisson process, Poisson point process, prospective geology, prospectivity, spatial point process, spatial statistics, split pixels, Western Australia, 62H11, 62J12, 60G55, 62M30, 60E99
Viani A.B. Djeundje, Iain D. Currie
Electron. J. Statist. 4, 1202-1224, (2010) DOI: 10.1214/10-EJS583
KEYWORDS: B-splines, longitudinal data, mixed models, penalties, smoothing, truncated lines, 62G08, 62J07
Willem Kruijer, Judith Rousseau, Aad van der Vaart
Electron. J. Statist. 4, 1225-1257, (2010) DOI: 10.1214/10-EJS584
KEYWORDS: Rate-adaptive density estimation, Bayesian density estimation, Nonparametric density estimation, Convergence rates, location-scale mixtures, 62G07, 62G20
Elizabeth D. Schifano, Robert L. Strawderman, Martin T. Wells
Electron. J. Statist. 4, 1258-1299, (2010) DOI: 10.1214/10-EJS582
KEYWORDS: Convex optimization, iterative soft thresholding, lasso penalty, minimax concave penalty, non-convex optimization, smoothly clipped absolute deviation penalty, 65C60, 62J07, 62J05, 62J12
Laurent Duvernet, Christian Y. Robert, Mathieu Rosenbaum
Electron. J. Statist. 4, 1300-1323, (2010) DOI: 10.1214/10-EJS585
KEYWORDS: semi-martingales, Multifractal processes, limit theorems, Hypothesis testing, 60F05, 60G44, 62G10
Myriam Maumy, Davit Varron
Electron. J. Statist. 4, 1324-1344, (2010) DOI: 10.1214/09-EJS381
KEYWORDS: Empirical processes, Poisson process, large deviations
Noureddine El Karoui, Alexandre d’Aspremont
Electron. J. Statist. 4, 1345-1385, (2010) DOI: 10.1214/10-EJS577
Birte Muhsal, Natalie Neumeyer
Electron. J. Statist. 4, 1386-1401, (2010) DOI: 10.1214/10-EJS586
KEYWORDS: Asymptotic mean squared error, error distribution, Kernel estimation, likelihood method, Nonparametric regression, second order expansions, 62G07, 62G08
Juan José Fernández-Durán, María Mercedes Gregorio-Domínguez
Electron. J. Statist. 4, 1402-1410, (2010) DOI: 10.1214/10-EJS587
KEYWORDS: Differential geometry, maximum likelihood estimation, Newton algorithm, nonnegative Fourier series, smooth Riemann manifold, 49M15, 62G07, 49Q99
Zuofeng Shang
Electron. J. Statist. 4, 1411-1442, (2010) DOI: 10.1214/10-EJS588
KEYWORDS: Smoothing spline estimate, M-estimating equation, optimal convergence rate, Bahadur type representation, Sobolev Spaces, Fréchet derivative, quantile loss, Huber’s loss, 62G08, 62G35, 62G20
Hoang-Long Ngo
Electron. J. Statist. 4, 1443-1469, (2010) DOI: 10.1214/10-EJS590
KEYWORDS: Blumenthal-Getoor index, discrete observation, jump process, microstructure noise, non-ergodic process, nonparameric estimation, Parametric estimation, 60M09, 60J75, 60M05, 62G05
Hao Wang, Carlos M. Carvalho
Electron. J. Statist. 4, 1470-1475, (2010) DOI: 10.1214/10-EJS591
KEYWORDS: Hyper-inverse Wishart, junction trees, non-decomposable graphs, posterior simulation
Yuri I. Ingster, Alexandre B. Tsybakov, Nicolas Verzelen
Electron. J. Statist. 4, 1476-1526, (2010) DOI: 10.1214/10-EJS589
KEYWORDS: high-dimensional regression, Detection boundary, sparse vectors, Sparsity, minimax hypothesis testing, 62J05, 62G10, 62H20, 62G05, 62G08, 62C20, 62G20
Omkar Muralidharan
Electron. J. Statist. 4, 1527-1546, (2010) DOI: 10.1214/10-EJS592
KEYWORDS: Fisher transformation, sample correlation, column dependence, root mean squared correlation, matrix normal
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