Abstract
We prove that the Loop model, a well-known graphical expansion of the Ising model, is a factor of i.i.d. on unimodular random rooted graphs under various conditions, including in the presence of a non-negative external field. As an application we show that the gradient of the free Ising model is a factor of i.i.d. on simply connected unimodular planar maps having a locally finite dual. The key idea is to develop an appropriate theory of local limits of uniform even subgraphs with various boundary conditions and prove that they can be sampled as a factor of i.i.d. Another key tool we exploit is that the wired uniform spanning tree on a unimodular transient graph is a factor of i.i.d. This partially answers some questions posed by Hutchcroft [33].
Funding Statement
Research by the first and third authors supported in part by NSERC. Research by the second author supported in part by NSERC 50311-57400.
Acknowledgments
We thank Tom Hutchcroft for several inspiring comments on an earlier draft of the paper. We also thank Russ Lyons for pointing out several references regarding the proof of Theorem 1.4. Finally, we thank the anonymous referee for several valuable inputs and suggestions.
Citation
Omer Angel. Gourab Ray. Yinon Spinka. "Uniform even subgraphs and graphical representations of Ising as factors of i.i.d.." Electron. J. Probab. 29 1 - 31, 2024. https://doi.org/10.1214/24-EJP1082
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