VOL. 33 · NO. 3 | June 2005
Ann. Statist. 33 (3), (June 2005) Open Access
No abstract available
Ann. Statist. 33 (3), (June 2005) Open Access
No abstract available
Discussion Paper
P. Laurie Davies, Ursula Gather
Ann. Statist. 33 (3), 977-1035, (June 2005) DOI: 10.1214/009053604000001138 Open Access
KEYWORDS: Equivariance, Breakdown point, robust statistics, 62G07, 65D10, 62G20
Testing Methodology
Joseph P. Romano
Ann. Statist. 33 (3), 1036-1047, (June 2005) DOI: 10.1214/009053605000000048 Open Access
KEYWORDS: Asymptotically maximin, efficiency, equivalence tests, Hypothesis tests, large sample theory, 62F03, 62F05
Winfried Stute, Li-Xing Zhu
Ann. Statist. 33 (3), 1048-1083, (June 2005) DOI: 10.1214/009053605000000020 Open Access
KEYWORDS: Single-index model, Goodness-of-fit, maximin tests, omnibus tests, peak alternatives, 62H15, 62G08, 62E17
E. L. Lehmann, Joseph P. Romano, Juliet Popper Shaffer
Ann. Statist. 33 (3), 1084-1108, (June 2005) DOI: 10.1214/009053605000000066 Open Access
KEYWORDS: familywise error rate, maximin, monotonocity, multiple testing, stepdown and stepup procedures, 62J15, 62F03
Peter Hall, Ingrid Van Keilegom
Ann. Statist. 33 (3), 1109-1137, (June 2005) DOI: 10.1214/009053605000000039 Open Access
KEYWORDS: bandwidth, bootstrap, convex function, cumulative hazard rate, kernel methods, local alternative, monotone function, power, Survival analysis, 62G09, 62G10, 62G20, 62N03
E. L. Lehmann, Joseph P. Romano
Ann. Statist. 33 (3), 1138-1154, (June 2005) DOI: 10.1214/009053605000000084 Open Access
KEYWORDS: familywise error rate, multiple testing, p-value, stepdown procedure, 62J15, 62G10
Pattern Recognition and Classification
Gilles Blanchard, Donald Geman
Ann. Statist. 33 (3), 1155-1202, (June 2005) DOI: 10.1214/009053605000000174 Open Access
KEYWORDS: ‎classification‎, sequential hypothesis testing, hierarchical designs, coarse-to-fine search, pattern recognition, scene interpretation, 62H30, 62L05, 68T10, 62H15, 68T45, 90B40
A. B. Tsybakov, S. A. van de Geer
Ann. Statist. 33 (3), 1203-1224, (June 2005) DOI: 10.1214/009053604000001066 Open Access
KEYWORDS: Binary classification, edge estimation, Adaptation, margin, penalized classification rule, square root penalty, Sparsity, block thresholding, 62G07, 62G08, 62H30, 68T10
Nonparametric Theory and Methods
Rabi Bhattacharya, Vic Patrangenaru
Ann. Statist. 33 (3), 1225-1259, (June 2005) DOI: 10.1214/009053605000000093 Open Access
KEYWORDS: Fréchet mean, extrinsic mean, central limit theorem, Confidence regions, Bootstrapping, 62H11, 62H10
Enno Mammen, Byeong U. Park
Ann. Statist. 33 (3), 1260-1294, (June 2005) DOI: 10.1214/009053605000000101 Open Access
KEYWORDS: backfitting, Bandwidth selection, penalized least squares, plug-in rules, Nonparametric regression, Nadaraya–Watson, local polynomial smoothing, 62G07, 62G20
M. Studer, B. Seifert, T. Gasser
Ann. Statist. 33 (3), 1295-1329, (June 2005) DOI: 10.1214/009053604000001246 Open Access
KEYWORDS: nonparametric estimation, Additive models, model choice, curse of dimensionality, regularization, parameter selection, AIC, 62G08, 62H99
L. Reboul
Ann. Statist. 33 (3), 1330-1356, (June 2005) DOI: 10.1214/009053605000000138 Open Access
KEYWORDS: Variable binwidth histogram, adaptive estimation, hazard rate, nonhomogeneous Poisson process, data-driven estimator, unimodal function, U-shaped function, 62G05, 62G07, 62G08, 62N01, 62N02
Chong Gu, Ping Ma
Ann. Statist. 33 (3), 1357-1379, (June 2005) DOI: 10.1214/009053605000000110 Open Access
KEYWORDS: Correlated error, generalized cross-validation, longitudinal data, mixed-effect model, penalized least squares, repeated measures, smoothing spline, 62G08, 62G05, 62G20, 62H12, 41A15
Uwe Einmahl, David M. Mason
Ann. Statist. 33 (3), 1380-1403, (June 2005) DOI: 10.1214/009053605000000129 Open Access
KEYWORDS: Kernel-type function estimator, uniform in bandwidth, consistency, 60F15, 62G07, 62G08
Peter Hall, Qiwei Yao
Ann. Statist. 33 (3), 1404-1421, (June 2005) DOI: 10.1214/009053604000001282 Open Access
KEYWORDS: conditional distribution, cross-validation, Dimension reduction, kernel methods, leave-one-out method, local linear regression, Nonparametric regression, prediction, root-n consistency, time series analysis, 62E17, 62G05, 62G20
Change Point Problems
Gary Lorden, Moshe Pollak
Ann. Statist. 33 (3), 1422-1454, (June 2005) DOI: 10.1214/009053605000000183 Open Access
KEYWORDS: quality control, CUSUM, Shiryayev–Roberts, surveillance, statistical process control, Power one tests, renewal theory, nonlinear renewal theory, gamma distribution, 62L10, 62N10, 62F03, 62F05, 60K05
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