Journal of Applied Mathematics

Handing Tolerance Problem in Fault Diagnosis of Linear-Analogue Circuits with Accurate Statistics Approach

Xin Gao, HouJun Wang, and Zhen Liu

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Abstract

The tolerance handling in analogue fault diagnosis is a challenging problem. Although lots of methods are effective for fault diagnosis, it is hard to apply them to the case with tolerance influence. In this paper, a robust statistics-based approach is introduced for tolerance-influencing fault diagnosis. The advantage of this proposed method is that it can accurately locate the data fusion among fault states. In addition, the results in analogue benchmark (e.g., linear voltage divider circuit) indicate that it is effective in fault diagnosis in accordance with given fault diagnostic requirements (e.g., fault diagnosis error, fault detection rate).

Article information

Source
J. Appl. Math., Volume 2013 (2013), Article ID 414120, 9 pages.

Dates
First available in Project Euclid: 14 March 2014

Permanent link to this document
https://projecteuclid.org/euclid.jam/1394808248

Digital Object Identifier
doi:10.1155/2013/414120

Zentralblatt MATH identifier
06950658

Citation

Gao, Xin; Wang, HouJun; Liu, Zhen. Handing Tolerance Problem in Fault Diagnosis of Linear-Analogue Circuits with Accurate Statistics Approach. J. Appl. Math. 2013 (2013), Article ID 414120, 9 pages. doi:10.1155/2013/414120. https://projecteuclid.org/euclid.jam/1394808248


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References

  • T. Y. Hong and H. Y. Yi Gang, “A new fault dictionary method for fault diagnosis of analogue circuits,” Microelectronics, vol. 31, pp. 252–254, 2001.
  • Z. Czaja and R. Zielonko, “Fault diagnosis in electronic circuits based on bilinear transformation in 3-D and 4-D spaces,” IEEE Transactions on Instrumentation and Measurement, vol. 52, no. 1, pp. 97–102, 2003.
  • P. M. Lin and Y. S. Elcherif, “Analogue circuits fault dictionary. New approaches and implementation,” International Journal of Circuit Theory and Applications, vol. 13, no. 2, pp. 149–172, 1985.
  • J. Huanca and R. Spence, “New statistical algorithm for fault location in toleranced analogue circuits,” IEE Proceedings G, vol. 130, no. 6, pp. 243–251, 1983.
  • D. Grzechca and J. Rutkowski, “Fault diagnosis in analog electronic circuits: the SVM approach,” Metrology and Measurement Systems, vol. 4, pp. 583–589, 2009.
  • R. Sałat and S. Osowski, “Support Vector Machine for soft fault location in electrical circuits,” Journal of Intelligent and Fuzzy Systems, vol. 22, no. 1, pp. 21–31, 2011.
  • F. Aminian, “Fault diagnosis of nonlinear analog circuits using neural networks with wavelet and fourier transforms as preprocessors,” Journal of Electronic Testing, vol. 17, no. 6, pp. 471–481, 2001.
  • B. Long, S. Tian, and H. Wang, “Diagnostics of filtered analogue circuits with tolerance based on LS-SVM using frequency features,” Journal of Electronic Testing, vol. 28, pp. 291–300, 2012.
  • W. Peng and Y. Shiyuan, “A soft fault dictionary method for analogue circuit diagnosis based on slope fault mode,” IEEE Transactions on Automatic Control, vol. 22, pp. 1–23, 2006.
  • L. Zhou, Y. Shi, J. Tang, and Y. Li, “Soft fault diagnosis in analogue circuit based on fuzzy and direction vector,” Metrology and Measurement Systems, vol. 16, pp. 61–75, 2009.
  • K. C. Varghese, J. Hywel Williams, and D. R. Towill, “Simplified ATPG and analog fault location via a clustering and separability technique,” IEEE Transactions on Circuits and Systems, vol. 26, no. 7, pp. 496–505, 1979.
  • S. Freeman, “Optimum fault isolation by statistical inference,” IEEE Transactions on Circuits and Systems, vol. 26, no. 7, pp. 505–512, 1979.
  • W. H. Hayt Jr., J. E. Kemmerly, and S. M. Durbin, Engineering Circuit Analysis, McGraw-Hill, New York, NY, USA, 7th edition, 2007.
  • C. Yang, S. Tian, B. Long, and F. Chen, “Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis,” IEEE Transactions on Instrumentation and Measurement, vol. 60, no. 1, pp. 176–185, 2011.
  • W. Peng and Y. Shiyuan, “Circuit tests based on the linear rela-tionships between changes in node voltages,” Journal of Tsi-nghua University, vol. 47, pp. 1245–1248, 2007 (Chinese).
  • D. V. Hinkley, “On the ratio of two correlated normal random variables,” Biometrika, vol. 56, pp. 635–639, 1969.
  • Z. Drezner and G. O. Wesolowsky, “On the computation of the bivariate normal integral,” Journal of Statistical Computation and Simulation, vol. 35, no. 1-2, pp. 101–107, 1990.