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Home > Proceedings > Berkeley Symp. on Math. Statist. and Prob. > Proceedings of the Sixth Berkeley Symposium on Mathematical Statistics and Probability, Volume 1: Theory of Statistics > On the Wiener process approximation to Bayesian sequential testing problems
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VOL. 6.1 | 1972 On the Wiener process approximation to Bayesian sequential testing problems
P. J. Bickel, J. A. Yahav

Editor(s) Lucien M. Le Cam, Jerzy Neyman, Elizabeth L. Scott

Berkeley Symp. on Math. Statist. and Prob., 1972: 57-83 (1972)
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