Line segments in the isotropic planar STIT tessellation

Abstract

This paper presents a powerful characterisation for the structure of internal vertices of the STIT's I-segments. The characterisation allows certain mathematical analyses to be performed easily. We demonstrate this by deriving new results for various topological properties of the tessellation: for example, the numbers of various types of edge and cell side within the typical I-segment. The characterisation also provides a tool for the calculations of metric properties of the tessellation; many new length distributions and frame-coverage results are given.